Test Technology of Automotive Grade Chip: Methods, Challenges and Applications

Abstract

With the development of automobile electronization and intelligence, the reliability and performance of automobile grade chip are very important. This article provides an in-depth exploration of the current status, challenges, and applications of automotive specification chip testing technology. Firstly, the traditional testing methods, such as functional verification, performance evaluation, single chip testing, defect screening and electrical parameter verification, are summarized, and the advanced testing technologies, including energy-saving test optimization, multi-layer and vertical chip testing, embedded core component testing and intelligent and automatic means, are introduced. Secondly, it analyzes the technical challenges faced by the chip test of automotive regulation level, such as the increase of chip complexity, the stability in extreme environment and the safety requirements of automatic driving function; Cost challenges, such as the increase in test coverage and complexity; And standardization challenges, such as the update of international standard system and the particularity of RF chip testing. Finally, through the application of 3D stacked chips in the intelligent cockpit controller and the functional safety test case of MCU based on ISO26262, the practical application of the car-gauge chip test technology is demonstrated. The purpose of this paper is to provide reference for the development of chip testing technology for automotive specifications, and to promote the progress of related technologies, thus contributing to the safe and reliable development of the automobile industry.